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Products
ProbesAccuprobe provides a full range of probes used to test active and passive semiconductor and hybrid devices. Zadjustable probes provide the ultimate in flexibility and maintainability. Metal blades probes are the workhorse of the industry and are available in a wide range of types and sizes. Ceramic blade probes have particular application in sensitive and high-frequency measurement applications. Pogo probes are useful where uneven substrates need to be accessed and tested. A full page view of the probes profiles is available here. For additional information on these product types please click the links below.
Probe CardsAn extensive range of probe cards are available to suit many probing applications and test equipment. Semiconductor 4 1/2" probe cards can be mounted with any of the assortment of probe styles to suit the particular device under test and application. Epoxy ring style cards are also available in this size. The hybrid industry typically uses 6 1/2" probe cards commensurate with larger substrate and device sizes. Chip resistor probe cards suitable for laser trimming of arrays of chip resistor provide extremely high efficiency. Round probe cards can also use the full compliment of probe styles and are typically mounted to a load board. Low current and other device and substrate measurements use specialized parametric test probe cards.
EquipmentCustomers building and maintaining their own probe cards can benefit from the proven probe card assembly and planarization stations available from Accuprobe. Planarization is especially important to extend the life of a probe card and to ensure effective yield. Complimentary probe manipulation tools allow probes to be selectively adjusted to meet alignment and planarization specifications. AccessoriesAccuprobe laser trim card holders have long been the industry standard for flexible and efficient mounting of probe cards in laser trim systems. Probe card cleaning materials ensure effective use of probes and extend probe life.
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